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<p>[QUOTE=&quot;nesvt, post: 32442, member: 1749&quot;]I wouldn&#039;t be suprised if something like that develops soon.&nbsp; I&#039;m a software developer, but I focus mostly on business applications.&nbsp; I know someone that concentrates on scientific imaging software.&nbsp; His group developed something for the semi-conductor manufacturing industry.&nbsp; They take a scan of a wafer (round flat silicon wafer with many chips that have not yet been diced) and feed it through the software.&nbsp; It analyzes points on the object and also takes an overall analysis.&nbsp; If a mark is detected that shouldn&#039;t be there, they check everything around it to see how big it is, how deep, how long, raised or dented, etc.&nbsp; They compare the results with a database of prior images.&nbsp; They can narrow down the type of defect, how it was caused, and what machine it came from.&nbsp; It might not sound like much (especially with my poor explanation), but it saves millions of dollars.&nbsp; They can tell that machine #1187B, in production line ABC, in the 4,648th step of manufacturing.... has a piece of dust on a certain part.</p><p>The same exact concept could be used to identify Morgan and Peace VAMs.&nbsp; It could probably also be used to grade coins.[/QUOTE]</p><p><br /></p>

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