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<p>[QUOTE="mikem2000, post: 1310169, member: 30574"]Doug,</p><p><br /></p><p>You are one stubborn man ( I like that <img src="styles/default/xenforo/clear.png" class="mceSmilieSprite mceSmilie1" alt=":)" unselectable="on" unselectable="on" />, It keeps things interesting).</p><p>First, if you read my posts I never called them Die Polish marks, the fact is I do not know how they got on the dies. I just showed you unquestionable proof that criss crossing lines can and do show up on dies as in the 1921 - S Morgan. You indicated this could could not happen, from the three scenarios you presented. A possible explanation, you indicated could be both die lines and coin scratches, which could explain the criss cross.. While I admit the coin may have a scrath or two, I can confidently say the vast majority if not all of those line are on the die.</p><p><br /></p><p>So how do I know that? Well I followed your advice and wiped/scratched a coin. The results were a real eye opener. First, the hairlines were much harder to detect on the devices as you mentioned, <b>but the were still present, </b>most easily seen on the faces of the broad letters. Now we get to the interesting part........ As the scratches approached the devices, they got weaker, since the devices themselves actually protected the area around them. This is totally logical, since the scratching material would be lifted as it approached the device. There was actaully a halo of a clean field directly surrounding the device. Also there were no scratches in the very protected areas such as the inside of an O. This is not the case on the Morgan or the Indian in question. If you look inside the O on the reverse of the Indian, it has a bunch of scratches. Also the scrathes run right up to the device, and in some case ever get stronger as in the right side of the shield. This is also totally logical, since the scratching material would actually be lowered a bit as it approached the recesses of the device. When you really start to look at this, you can see that die scratches and coin scratches have totally different characteristics.</p><p><br /></p><p>As for the grade, your statement that "A flaw is a flaw, no matter how or when it got there" you know that is just not true. In one case we have a striking flaw and in another we have PMD. The coin with PMD will take a much bigger hit. In addition an MS65 GEM is far from being a perfect coin. I stand by my opinion that the coin is deserving of the grade. </p><p><br /></p><p>Mike[/QUOTE]</p><p><br /></p>
[QUOTE="mikem2000, post: 1310169, member: 30574"]Doug, You are one stubborn man ( I like that :), It keeps things interesting). First, if you read my posts I never called them Die Polish marks, the fact is I do not know how they got on the dies. I just showed you unquestionable proof that criss crossing lines can and do show up on dies as in the 1921 - S Morgan. You indicated this could could not happen, from the three scenarios you presented. A possible explanation, you indicated could be both die lines and coin scratches, which could explain the criss cross.. While I admit the coin may have a scrath or two, I can confidently say the vast majority if not all of those line are on the die. So how do I know that? Well I followed your advice and wiped/scratched a coin. The results were a real eye opener. First, the hairlines were much harder to detect on the devices as you mentioned, [B]but the were still present, [/B]most easily seen on the faces of the broad letters. Now we get to the interesting part........ As the scratches approached the devices, they got weaker, since the devices themselves actually protected the area around them. This is totally logical, since the scratching material would be lifted as it approached the device. There was actaully a halo of a clean field directly surrounding the device. Also there were no scratches in the very protected areas such as the inside of an O. This is not the case on the Morgan or the Indian in question. If you look inside the O on the reverse of the Indian, it has a bunch of scratches. Also the scrathes run right up to the device, and in some case ever get stronger as in the right side of the shield. This is also totally logical, since the scratching material would actually be lowered a bit as it approached the recesses of the device. When you really start to look at this, you can see that die scratches and coin scratches have totally different characteristics. As for the grade, your statement that "A flaw is a flaw, no matter how or when it got there" you know that is just not true. In one case we have a striking flaw and in another we have PMD. The coin with PMD will take a much bigger hit. In addition an MS65 GEM is far from being a perfect coin. I stand by my opinion that the coin is deserving of the grade. Mike[/QUOTE]
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Do you ever look at old coin pix and think ugh?
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